Intel: Manufacturing Root Cause Analysis
Learn how Intel leveraged Articul8's platform to build a GenAI-powered root cause analysis (RCA) application that saved millions by minimizing fab equipment downtime.
Background
Chip manufacturing is a complex, dynamic process that requires constant monitoring, analysis, and optimization. Intel developed a manufacturing 'incident assistant' using Articul8's GenAI platform to diagnose & resolve manufacturing problems & improve overall manufacturing process efficiency.
Challenge
Machine downtime in semiconductor fabs costs millions of dollars. Identifying issues during downtime is complicated, highly manual, and depends on the engineer/technician's work experience as well as the ability to draw quick insights from past historical data and multiple data sources and types (structured, unstructured data, time series data, etc.). Intel was looking for a GenAI powered solution to diagnose & resolve manufacturing problems & improve overall manufacturing process efficiency.
Solution
Using Articul8's GenAI platform, Intel ingested and analyzed structured and unstructured data from diverse sources, including historical data and real-time feeds from sensors and semiconductor manufacturing equipment, to empower manufacturing engineers and technicians to gain valuable insights into their manufacturing operations and make data-driven decisions for failure mode root cause analysis, reduction of manufacturing downtime, automated work order creation, and improving overall manufacturing process efficiency.
Outcomes
Using the Articul8 GenAI platform, Intel processed decades of structured and unstructured data from a number of sources such as machine logs, knowledge articles, and internal knowledge wiki pages to develop a natural language based GenAI application for manufacturing equipment root cause analysis (RCA). This resulted in accelerated incident resolution times, thousands of hours saved in highly skilled labor productivity, saving millions in fab equipment downtime costs per year & improving overall manufacturing efficiency.